Material Classification using Raw Time-of-Flight Measurements

Shuochen Su, Felix Heide, Robin Swanson, Jonathan Klein, Clara Callenberg, Matthias B. Hullin, Wolfgang Heidrich
Proc. IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2016.

Abstract

We propose a material classification method using raw time-of-flight (ToF) measurements. ToF cameras capture the correlation between a reference signal and the temporal response of material to incident illumination. Such measurements encode unique signatures of the material, i.e. the degree of subsurface scattering inside a volume. Subsequently, it offers an orthogonal domain of feature representation compared to conventional spatial and angular reflectance-based approaches. We demonstrate the effectiveness, robustness, and efficiency of our method through experiments and comparisons of real-world materials.

Files